Featured Academic News Story: Investigating the World with a Scanning Electron Microscope
Story posted January 13, 2004
Thanks to a grant from the National Science Foundation and the work of Assistant Professor of Geology Rachel Beane, Bowdoin recently became one of the few colleges and universities in the United States to add an Electron Backscatter Diffractometer (EBSD) to a Scanning Electron Microscope (SEM).
The scanning electron microscope magnifies specimens to as much as 300,000 times magnification, and Bowdoin's SEM was already equipped with an Energy Dispersive Spectrometer (EDS), to allow chemical analysis of specimens. But the addition of the EBSD will let Beane and her students investigate the growth of minerals by observing their crystal lattice structures.
To read the full story, visit Bowdoin's Academic News site.
« Back | Campus News | Academic Spotlight | | Subscribe to Bowdoin News by Email